Light Meter NIST Cert MPN:SDL400-NIST
Light Meter NIST Cert
The SDL400 records data on an SD card in Excel format. Wide range to 10,000Fc or 100kLux. Cosine and color-corrected measurements. Utilizes precision silicon photo diode and spectral response filter. Offset adjustment used for zero function to make relative measurements. Adjustable data sampling rate. Stores 99 readings manually and 20M readings via 2G SD card. Type K/J Thermocouple input for high temperature measurements. Large backlit LCD display. Record/Recall Min, Max, Data Hold and Auto power off. Built-in PC interface.
Technical Specifications
- Item Light Meter
- Lighting Types All Visible Light
- Measuring Range 0 to 10, 000 FC, 0 to 100, 000 Lux
- Resolution 0.1Fc/1Lux
- Accuracy +/-4%
- Display 9,999 Count Backlit LCD
- Data Hold Yes
- Min./Max. Memory Yes
- Data Logging 20M Readings
- Interface SD Card and RS-232
- Memory 2G SD Card
- Auto Power Off Yes
- Battery Type (6) AA
- Sensor Photo Diode and Color Correction Filter, Spectrum Designed to Meet CIE
- Cord Length 39 in
- Calibration Certificate NIST Certificate included
- Includes Battery, Carrying Case, Instructions, Protective Cover, SD Card
- Manufacturers Warranty Length 3 yr
Manufacturer Details
- Manufacturer: Extech
- Condensed Mfg Number: SDL400NIST
- MPN: SDL400-NIST
Label Details
- Hazardous Material: N
- Green Material Flag: N
- Country of Origin: TW
- CA Prop 65 Wht Label: N
Classification Details
- Harmonization Code: 9027504050
- GDS Category Name: Light Meters
- GDS Family Name: Nonelectrical Properties Testing
- GDS Segment Name: Test Instruments
- UNSPSC: 41115308
- UNSPSC Class ID: 53
- UNSPSC Commodity Name: Light and wave generating and measuring equipment
- UNSPSC Commodity ID: 08
- UNSPSC Commodity Name: Lightmeters
- UNSPSC Family ID: 11
- UNSPSC Family Name: Measuring and observing and testing instruments
- UNSPSC Segment ID: 41
- UNSPSC Segment Name: Laboratory and Measuring and Observing and Testing Equipment
Shipping Details
- Not For Sale In: HI AK PR
Product info last updated on April 3, 2024 10:36pm UTC
Category: Nonelectrical Properties Testing